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Semiconductor device
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#	Item
361	CONTENTS Electrical & Electronic Engineering............................ 1 Nuclear Power ....................................................... 11 Information and Communication Technology13 Computer S Add to Reading List Source URL: www.ohmsha.co.jp Language: English - Date: 2014-07-17 02:07:05 Semiconductor device fabrication Electrical engineering Semiconductor devices Electronics Power electronics Electric double-layer capacitor Reliability Lighting Electronic engineering Electromagnetism Technology Physics
362	Client Success Story Texas Instruments Lehigh Valley (Formerly CICLON Semiconductor Device Corporation) Ben Franklin TechVentures 116 Research Drive Add to Reading List Source URL: nep.benfranklin.org Language: English - Date: 2012-09-11 11:21:13 Semiconductor companies Lehigh Valley Bethlehem Pennsylvania Texas Instruments MOSFET Semiconductor device Transistor Technology Electronic engineering Electronics
363	Physica B 308––655 Positron annihilation study of vacancy-type defects in silicon carbide co-implanted with aluminum and carbon ions Takeshi Ohshimaa,, Akira Uedonob, Hiroshi Abea, Z.Q. Chenb,1, Hisay Add to Reading List Source URL: www.geocities.jp Language: English* - Date: 2003-02-11 04:15:49 Semiconductor device fabrication Annealing Ion implantation Silicon carbide Chemistry Materials science Manufacturing
364	1 Gate Counts The chart represents the number of people passing through the security gates at each library. Libraries not listed do not keep a gate count. Alderman1 Add to Reading List Source URL: assessment.library.virginia.edu Language: English - Date: 2014-07-28 12:22:32 Mon Architecture Gate count Semiconductor device fabrication Fiske Kimball
365	Microsoft Word - 2_21_Hidemi_Ishiuchi_ABSTRACT_BIO.docx Add to Reading List Source URL: inc11.org Language: English - Date: 2015-04-13 05:43:24 Logic families Electronic design Computer memory Semiconductors Nanoelectronics Semiconductor industry Dynamic random-access memory Semiconductor device MOSFET Electronic engineering Technology Electronics
366	Technical Data Sheet • page 1 of 2 AMS, Inc. 105 Harrison Street American Falls, Idaho 83211 Add to Reading List Source URL: www.ams-samplers.com Language: English - Date: 2015-02-20 14:10:46 Matter Chemistry Nitrides Semiconductor device fabrication Titanium nitride
367	Photon Factory Activity Report 2009 #27 Part BSurface and Interface 2C/2008S2003 Annealing effects of in-depth profiles in TiN/LaO/HfSiO/SiO2/Si gate stack Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-12-27 22:22:07 Materials science Semiconductor device fabrication Electronic engineering Superhard materials Condensed matter physics Photoemission spectroscopy Atomic layer deposition Titanium nitride Silicon dioxide Chemistry Emission spectroscopy Matter
368	Chemical Engineers and Semiconductors Add to Reading List Source URL: www.chemicalengineering.org Language: English - Date: 2010-08-02 15:56:43 Electronic engineering Integrated circuit Semiconductor device Applied Materials Doping Wafer Semiconductor Transistor Epitaxy Semiconductor device fabrication Technology Materials science
369	Measuring the absolute decay probability of implantation 82 Sr by ion Add to Reading List Source URL: www.phy.ornl.gov Language: English - Date: 2012-12-17 16:10:10 Radioactivity Nuclear physics Ions Charge carriers Ion implantation Ion source Electron Ion Beta decay Physics Chemistry Semiconductor device fabrication
370	Photon Factory Activity Report 2006 #24 Part BSurface and Interface 1C, 18A/2005G089 Change in conductivity through the space-charge layer of the Si substrate Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:33:38 Semiconductor device fabrication Thin film deposition Epitaxy

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